Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, Wafer Probe Card, ATE Load Board, Burn-in Socket and High Density Coaxial Connector

Qualmax offers Spring Contact Probe for Lead Free Application  

Double-ended Probe    Single-ended Probe    Solid Pd Alloy Probe    Coaxial Probe     Kelvin Probe

Battery Contact   Interface Probe     In-Circuit Test Probe

Solid Pd Alloy Probe

Solid Pd Alloy Probes are developed to address the plunger tip contamination issue often found in the
testing of the lead free solder ball packages including SAC105 and SAC305. It also shows excellent
contact resistance throughout the life span, which makes it a perfect choice for any high bandwidth
applications.

 

Problems   

  • Sn easily transfered to the plunger tip
  • Relatively short life span of probe
  • High Cres even after the cleaning of the probe
  • Unstable Contact Resistance
  • Probe cleaning required frequently
  • Sn contamination is not not easy to clean

Solution

  • Solid Pd Alloy plunger
  • Very low resistance
  • Very stable resistance
  • Very good for critical lead free applications
  • Either Single-ended type or Double-ended type probes can be made
  • No cleaning is required until about 200,000 touch downs depends on the application


Click this buttun to search your pogo pin in Qualmax data base.

 

   

 

 

 

 

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Solid Pd Alloy Probes  

RF Coaxial Test Socket

Elastomeric Socket     

Press Releases

Download Qualmax Corporate Brochure

Trade Shows

See us at BITS 2012

See us at SWTW 2012

 

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.